Abstract
We report a technique for investigating nucleation and growth confined to nanometer scale surfaces. Lithographic and etching processes were used to create arrays of 100 and 150 nm holes through a thin SiO2 layer onto Si(100). Ge dots were nucleated and grown to a few nanometers in diameter within the patterned wells. Transmission electron and atomic force microscopic analyses revealed the presence of 0-1 Ge quantum dots in each of the 100 nm wells and 2-4 dots in the 150 nm wells. For the latter case, size-distance correlations indicated the effective radius of the diffusion field around a growing Ge particle was much larger than for growth on an infinite surface.
| Original language | English |
|---|---|
| Pages (from-to) | 3144-3149 |
| Number of pages | 6 |
| Journal | Journal of Physical Chemistry |
| Volume | 100 |
| Issue number | 8 |
| DOIs | |
| State | Published - Feb 22 1996 |
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